M, Prasanna Kumar; RAJ, Likhith K; M, Karthik; BARKER, Chandu Shivaputrappa; R, Manoj. Enhancing Laboratory Experience: A Combination of RFID and Machine Learning Techniques to Track Attendance and Upgrade Hardware. International Journal of Innovative Research in Computer Science & Technology, [S. l.], v. 12, n. 3, p. 113–119, 2024. Disponível em: https://ijircst.irpublications.org/index.php/ijircst/article/view/82. Acesso em: 5 jul. 2024.