M, Prasanna Kumar, Likhith K Raj, Karthik M, Chandu Shivaputrappa Barker, and Manoj R. “Enhancing Laboratory Experience: A Combination of RFID and Machine Learning Techniques to Track Attendance and Upgrade Hardware”. International Journal of Innovative Research in Computer Science & Technology 12, no. 3 (May 1, 2024): 113–119. Accessed July 5, 2024. https://ijircst.irpublications.org/index.php/ijircst/article/view/82.